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  <titleInfo>
    <title>Quantitative depth profiling and diffusion in thin films</title>
  </titleInfo>
  <name type="personal">
    <namePart>Wang, Jiangyong</namePart>
    <role>
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    </role>
  </name>
  <name type="personal">
    <namePart> Lian, Songyou</namePart>
  </name>
  <name type="personal">
    <namePart> Yan, Xinliang</namePart>
  </name>
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    <place>
      <placeTerm type="text">Singapore</placeTerm>
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    <publisher>World Scientific Publishing</publisher>
    <dateIssued>2025</dateIssued>
    <dateIssued encoding="marc">9999</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <language>
    <languageTerm authority="iso639-2b" type="code">und</languageTerm>
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  <language>
    <languageTerm authority="iso639-2b" type="code">Eng</languageTerm>
  </language>
  <language>
    <languageTerm authority="iso639-2b" type="code">lis</languageTerm>
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  <language>
    <languageTerm authority="iso639-2b" type="code">h</languageTerm>
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  <physicalDescription>
    <extent>xi, 266 p.; hb</extent>
  </physicalDescription>
  <note type="statement of responsibility">Jiangyong Wang</note>
  <subject>
    <topic> Applied physical chemistry</topic>
  </subject>
  <subject>
    <topic> Diffusion</topic>
  </subject>
  <subject>
    <topic>Chemical engineering</topic>
  </subject>
  <classification authority="ddc">660.294 WAN</classification>
  <identifier type="isbn">9789819811922</identifier>
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