000			01471nam a2200265 a 4500
003			CUTN
005			20180518123827.0
008			010412s2001 nyua b 001 0 eng d
020			_a0201610914
020			_a9789332535169
041			_aEnglish
082			_a537.53 _bCUL
100	1		_aCullity, B. D.
245	1	0	_aElements of X-ray diffraction _cB.D. Cullity, S.R. Stock.
250			_a3rd ed.
260			_aNoida : _bPearson India Education, _cc2014.
300			_axviii, 652 p. : _bill. ; _c24 cm.
505			_t1. Properties of X-rays. _t2. Geometry of Crystals. _t3. Diffraction I: Directions of Diffracted Beams. _t4. Diffraction II: Intensities of Diffracted Beams. _t5. Diffraction III: Non-Ideal Samples. _t6. Laure Photographs. _t7. Powder Photographs. _t8. Diffractometer and Spectrometer. _t9. Orientation and Quality of Single Crystals. _t10. Structure of Polycrystalline Aggregates. _t11. Determination of Crystal Structure. _t12. Precise Parameter Measurements. _t13. Phase-Diagram Determination. _t14. Order-Disorder Transformation. _t15. Chemical Analysis of X-ray Diffraction. _t16. Chemical Analysis by X-ray Spectrometry. _t17. Measurements of Residual Stress. _t18. Polymers. _t19. Small Angle Scatters. _t20. Transmission Electron Microscope.
650		0	_aX-rays
700	1		_aStock, Stuart R.
942			_2ddc _cBOOKS
100	1		_q(Bernard Dennis)
504			_aIncludes bibliographical references and index.
650		0	_xDiffraction.
999			_c24888 _d24888