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020			_a9780262150545
020			_a0262150549 (Trade Cloth) _cUSD 50.00 Retail Price (Publisher)
024	3		_a9780262150545
035			_a(WaSeSS)ssj0000097756
037			_b00015994
040			_aBIP US _dWaSeSS _cCLC
050		4	_aQC174.85.M43A38 2001
082	0	0	_a530.15/95 _221
100	1		_aOpper, Manfred _eEditor _4edt _zOPP
210	1	0	_aAdvanced Mean Field Methods
245	1	0	_aAdvanced Mean Field Methods _h[electronic resource]: _bTheory and Practice
260			_aCambridge : _bMIT Press _cJune 2001
440		0	_aNeural Information Processing Ser.
506			_aLicense restrictions may limit access.
520	8		_aAnnotation _bA major problem in modern probabilistic modeling is the huge computational complexity involved in typical calculations with multivariate probability distributions when the number of random variables is large. Because exact computations are infeasible in such cases and Monte Carlo sampling techniques may reach their limits, there is a need for methods that allow for efficient approximate computations. One of the simplest approximations is based on the mean field method, which has a long history in statistical physics. The method is widely used, particularly in the growing field of graphical models.Researchers from disciplines such as statistical physics, computer science, and mathematical statistics are studying ways to improve this and related methods and are exploring novel application areas. Leading approaches include the variational approach, which goes beyond factorizable distributions to achieve systematic improvements; the TAP (Thouless-Anderson-Palmer) approach, which incorporates correlations by including effective reaction terms in the mean field theory; and the more general methods of graphical models.Bringing together ideas and techniques from these diverse disciplines, this book covers the theoretical foundations of advanced mean field methods, explores the relation between the different approaches, examines the quality of the approximation obtained, and demonstrates their application to various areas of probabilistic modeling.
521			_aScholarly & Professional _bMIT Press
521	2		_a17 _bMIT Press
700	1		_aSaad, David _eEditor _4edt
773		0	_tIEEE - MIT Press eBooks LIbrary
856	4	0	_uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio10187396 _zFull text available from IEEE - MIT Press eBooks LIbrary
910			_aBowker Global Books in Print record
942			_2ddc _cBOOKS
999			_c3172 _d3172