Fundamentals of powder diffraction and structural characterization of materials

Pecharsky, Vitalij K.; Zavalij, Peter Y.

Fundamentals of powder diffraction and structural characterization of materials - US Springer 2003 - 713

9780387241470


X-ray crystallography,Powders--Optical properties--Measurement,X-rays--Diffraction--Measurement,Physical organic chemistry,Condensed matter,Crystallography,Particles (Nuclear physics),Chemistry

548.83 / PEC

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