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Quantitative depth profiling and diffusion in thin films /

Wang, Jiangyong

Quantitative depth profiling and diffusion in thin films / Jiangyong Wang - Singapore : World Scientific Publishing, 2025. - xi, 266 p.; hb

ISBN: 9789819811922

Subjects--Topical Terms:
Applied physical chemistry
Diffusion
Chemical engineering

Dewey Class. No.: 660.294 / WAN

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