MARC details
| 000 -LEADER |
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| fixed length control field |
03117cam a2200481 a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
CUTN |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20171103144909.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
030224s2003 enka 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
0198509154 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780199552757 (pbk.) |
| 082 0# - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
502.825 |
| Edition number |
21 |
| Item number |
SPE |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Spence, John C. H. |
| 245 10 - TITLE STATEMENT |
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| Title |
High-resolution electron microscopy / |
| Statement of responsibility, etc |
John C.H. Spence. |
| 250 ## - EDITION STATEMENT |
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| Edition statement |
3rd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
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| Place of publication, distribution, etc |
Oxford : |
| Name of publisher, distributor, etc |
Oxford University Press, |
| Date of publication, distribution, etc |
2003. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xvi, 401 p., [4] p. of plates : |
| Other physical details |
ill. (some col.) ; |
| Dimensions |
24 cm. |
| 500 ## - GENERAL NOTE |
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| General note |
The discovery of the Nanotube in 1991 by electron microscopy has ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. The book covers the usefulness of seeing atoms in the semiconductor industry, in materials science (where scientists strive to make new lighter,stronger, cheaper materials), and condensed matter physics (for example in the study of the new superconductors). Biologists have recently used the atomic-resolution electron microscope to obtain three-dimensional images of the Ribosome, work which is covered in this book. The books also shows how the ability to see atomic arrangements has helped us understand the properties of matter. |
| 505 ## - FORMATTED CONTENTS NOTE |
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| Contents |
1. Preliminaries ; 2. Electron Optics ; 3. Wave Optics ; 4. Coherence and Fourier Optics ; 5. High-Resolution Images of Crystals and their Defects ; 6. HREM in Biology, Organic Crystals and Radiation Damage ; 7. Image Processing and Superresolution Schemes ; 8. Stem and Z-Contrast ; 9. Electron Sources and Detectors ; 10. Measurement of Electron-optical Parameters Affecting High-Resolution Images ; 11. Instabilities and the Microscope Environment ; 12. Experimental Methods ; 13. Associated Techniques |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Materials Science |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
High resolution electron microscopy |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Electron microscopy |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Transmission electron microscopes |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Materials--Microscopy |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Mineralogy, Determinative |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Optical mineralogy |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Electron microscopy--Technique |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Transmission electron microscopy |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Scientific Equipment, Experiments & Techniques |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Microscopy |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Instruments & Instrumentation Engineering |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Condensed Matter Physics (liquid State & Solid State Physics) |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Spence, John C. H. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
General Books |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
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| Bibliography, etc |
Includes bibliographical references and index. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
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| Title of a work |
Experimental high-resolution electron microscopy. |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
|---|
| Uniform title |
Monographs on the physics and chemistry of materials ; |
| Volume number/sequential designation |
60 |
