MARC details
000 -LEADER |
fixed length control field |
01471nam a2200265 a 4500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
CUTN |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20180518123827.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
010412s2001 nyua b 001 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0201610914 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9789332535169 |
041 ## - LANGUAGE CODE |
Language |
English |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
537.53 |
Item number |
CUL |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Cullity, B. D. |
245 10 - TITLE STATEMENT |
Title |
Elements of X-ray diffraction |
Statement of responsibility, etc |
B.D. Cullity, S.R. Stock. |
250 ## - EDITION STATEMENT |
Edition statement |
3rd ed. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc |
Noida : |
Name of publisher, distributor, etc |
Pearson India Education, |
Date of publication, distribution, etc |
c2014. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xviii, 652 p. : |
Other physical details |
ill. ; |
Dimensions |
24 cm. |
505 ## - FORMATTED CONTENTS NOTE |
Title |
1. Properties of X-rays. |
-- |
2. Geometry of Crystals. |
-- |
3. Diffraction I: Directions of Diffracted Beams. |
-- |
4. Diffraction II: Intensities of Diffracted Beams. |
-- |
5. Diffraction III: Non-Ideal Samples. |
-- |
6. Laure Photographs. |
-- |
7. Powder Photographs. |
-- |
8. Diffractometer and Spectrometer. |
-- |
9. Orientation and Quality of Single Crystals. |
-- |
10. Structure of Polycrystalline Aggregates. |
-- |
11. Determination of Crystal Structure. |
-- |
12. Precise Parameter Measurements. |
-- |
13. Phase-Diagram Determination. |
-- |
14. Order-Disorder Transformation. |
-- |
15. Chemical Analysis of X-ray Diffraction. |
-- |
16. Chemical Analysis by X-ray Spectrometry. |
-- |
17. Measurements of Residual Stress. |
-- |
18. Polymers. |
-- |
19. Small Angle Scatters. |
-- |
20. Transmission Electron Microscope. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
X-rays |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Stock, Stuart R. |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Dewey Decimal Classification |
Koha item type |
General Books |
100 1# - MAIN ENTRY--PERSONAL NAME |
Fuller form of name |
(Bernard Dennis) |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc |
Includes bibliographical references and index. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
General subdivision |
Diffraction. |