Crystal growth and evaluation of silicon for VLSI and ULSI / (Record no. 46027)

MARC details
000 -LEADER
fixed length control field 02597cam a2200493 i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251022173422.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 141125s2015 flua ob 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781482232820
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1482232820
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780429068393
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0429068395
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781322637693
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1322637695
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN 9781482232813
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN 9781138034198
041 ## - LANGUAGE CODE
Language English
049 ## - LOCAL HOLDINGS (OCLC)
Holding library MAIN
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC
Subject category code subdivision 009010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 661.068
Edition number 23
Item number ERA
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Eranna, G.,
245 10 - TITLE STATEMENT
Title Crystal growth and evaluation of silicon for VLSI and ULSI /
Statement of responsibility, etc Golla Eranna.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher, distributor, etc CRC Press,
Date of publication, distribution, etc 2015.
300 ## - PHYSICAL DESCRIPTION
Extent xvii, 411 pages :
Other physical details illustrations.
500 ## - GENERAL NOTE
General note "A Chapman & Hall book."
505 0# - FORMATTED CONTENTS NOTE
Contents 1. Introduction -- 2. Silicon : the key material for integrated circuit fabrication technology -- 3. Importance of single crystals for integrated circuit fabrication -- 4. Different techniques for growing single-crystal silicon -- 5. From silicon ingots to silicon wafers -- 6. Evaluation of silicon wafers -- 7. Resistivity and impurity concentration mapping of silicon wafers -- 8. Impurities in silicon wafers -- 9. Defects in silicon wafers -- 10. Silicon wafer preparation for VLSI and ULSI processing -- 11. Packing of silicon wafers.
520 ## - SUMMARY, ETC.
Summary, etc Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and in various other forms in nature, silicon is difficult to separate from its chemical compounds because of its reactivity. As a solid, silicon is chemically inert and stable, but growing it as a single crystal creates many technological challenges.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Silicon crystals.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Silicon crystals
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Crystal growth.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Integrated circuits
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Integrated circuits
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://go.oreilly.com/university-of-glasgow/library/view/-/9781482232813/?ar">https://go.oreilly.com/university-of-glasgow/library/view/-/9781482232813/?ar</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type General Books
100 1# - MAIN ENTRY--PERSONAL NAME
Relator term author.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
506 ## - RESTRICTIONS ON ACCESS NOTE
Terms governing access Access restricted to subscribing institutions.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
General subdivision Electric properties.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
General subdivision Very large scale integration.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
General subdivision Ultra large scale integration.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Print version:
Main entry heading Eranna, G.
Title Crystal growth and evaluation of silicon for VLSI and ULSI.
Place, publisher, and date of publication Boca Raton, FL : CRC Press : Taylor & Francis Group, 2015
International Standard Book Number 9781482232813
Record control number (OCoLC)902838097.
856 40 - ELECTRONIC LOCATION AND ACCESS
Public note Connect to resource
907 ## - LOCAL DATA ELEMENT G, LDG (RLIN)
a .b44461689
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Home library Location Shelving location Date of Cataloging Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Dewey Decimal Classification     Non-fiction CUTN Central Library CUTN Central Library Medicine, Technology & Management 22/10/2025   661.068 ERA 54608 22/10/2025 22/10/2025 General Books