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Wada, K . [Ed.]

Defects in optoelectronic materials K Wada; Stella W Pang - Amsterdam : Gordon and Breach Science Pub., ©2001. - 412 pages : illustrations ; 23 cm. - Optoelectronic properties of semiconductors and superlattices, v. 11. .

1. Saturation of Free Carrier Concentration in Semiconductors / W. Walukiewicz --
2. Point of Defect Formation Near Surfaces / K. Wada --

3. Optical Characterization of Plasma Etching Induced Damage / E.L. Hu and C.-H. Chen --


4. Dry Etch Damage in Widegap Semiconductor Materials / S.J. Pearton and R.J. Shul --



5. Generation, Removal, and Passivation of Plasma Process Induced Defects / S.W. Pang --



6. Defects Induced by Metal Semiconductor Contacts Formation / T. Okumura --




7. Electrical Characterization of Defects Introduced in Epitaxially Grown GaAs by Electron-, Proton- and He-Ion Irradiation / F.D. Auret --

8. Instability and Defect Reaction / Y. Shinozuka --







9. Defects and Device Degradation / K. Wada and H. Fushimi.









ISBN: 9056997149 9789056997144

Subjects--Topical Terms:
Optoelectronic devices -- Defects.
Optoelectronic devices.
Optoelectronics -- Materials.

Dewey Class. No.: 621.381 / WAD