MARC details
| 000 -LEADER |
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| fixed length control field |
01583nam a22002417a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
CUTN |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20190218141717.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
190218b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9056997149 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9789056997144 |
| 041 ## - LANGUAGE CODE |
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| Language |
English |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
621.381 |
| Item number |
WAD |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Wada, K . [Ed.] |
| 245 ## - TITLE STATEMENT |
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| Title |
Defects in optoelectronic materials |
| Statement of responsibility, etc |
K Wada; Stella W Pang |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
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| Place of publication, distribution, etc |
Amsterdam : |
| Name of publisher, distributor, etc |
Gordon and Breach Science Pub., |
| Date of publication, distribution, etc |
©2001. |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
412 pages : |
| Other physical details |
illustrations ; |
| Dimensions |
23 cm. |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
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| Title |
Optoelectronic properties of semiconductors and superlattices, |
| Volume number/sequential designation |
v. 11. |
| 505 ## - FORMATTED CONTENTS NOTE |
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| Title |
1. Saturation of Free Carrier Concentration in Semiconductors / W. Walukiewicz --<br/> |
| -- |
2. Point of Defect Formation Near Surfaces / K. Wada --<br/><br/> |
| -- |
3. Optical Characterization of Plasma Etching Induced Damage / E.L. Hu and C.-H. Chen --<br/><br/><br/> |
| -- |
4. Dry Etch Damage in Widegap Semiconductor Materials / S.J. Pearton and R.J. Shul --<br/><br/><br/><br/> |
| -- |
5. Generation, Removal, and Passivation of Plasma Process Induced Defects / S.W. Pang --<br/><br/><br/><br/> |
| -- |
6. Defects Induced by Metal Semiconductor Contacts Formation / T. Okumura --<br/><br/><br/><br/><br/> |
| -- |
7. Electrical Characterization of Defects Introduced in Epitaxially Grown GaAs by Electron-, Proton- and He-Ion Irradiation / F.D. Auret --<br/><br/> |
| -- |
8. Instability and Defect Reaction / Y. Shinozuka --<br/><br/><br/><br/><br/><br/><br/><br/> |
| -- |
9. Defects and Device Degradation / K. Wada and H. Fushimi.<br/><br/><br/><br/><br/><br/><br/><br/> |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Optoelectronic devices -- Defects. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Optoelectronic devices. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Optoelectronics -- Materials. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
General Books |
