MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01578pam a2200325 a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
CUTN |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20171103172223.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
050216s2006 enka b 001 0 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
008044640X (v.1 : hbk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9780080446394 (v.2 :hbk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0080446396 (v.2 : hbk.) |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.381 |
| Edition number |
22 |
| Item number |
MAC |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Machlin, E. S. |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Materials science in microelectronics / |
| Statement of responsibility, etc |
E.S. Machlin. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
Oxford : |
| Name of publisher, distributor, etc |
Elsevier, |
| Date of publication, distribution, etc |
2006. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
2 v. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Previous ed.: Croton-on-Hudson, N.Y. : Giro Press, 1995. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
The subject matter of thin-films - which play a key role in microelectronics - divides naturally into two headings: the processing / structure relationship, and the structure / properties relationship. Part II of 'Materials Science in Microelectronics' focuses on the latter of these relationships, examining the effect of structure on the following: * Electrical properties* Magnetic properties* Optical properties* Mechanical properties* Mass transport properties* Interface and junction properties* Defects and properties |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Contents |
v. 1. The relationships between thin film processing and structure -- v. 2. The effects of structure on properties in thin films. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Thin films |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Materials science. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Microelectronics. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
General Books |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc |
Includes bibliographical references and index. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| General subdivision |
Materials. |
| 948 ## - LOCAL PROCESSING INFORMATION (OCLC); SERIES PART DESIGNATOR (RLIN) |
|---|
| e (OCLC) |
scp |
