Elements of X-ray diffraction B.D. Cullity, S.R. Stock.
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TextLanguage: English Publication details: Noida : Pearson India Education, c2014.Edition: 3rd edDescription: xviii, 652 p. : ill. ; 24 cmISBN: - 0201610914
- 9789332535169
- 537.53 CUL
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| 537.53 CUL Elements of X-ray diffraction | 537.53 CUL Elements of X-ray diffraction | 537.53 CUL Elements of X-ray diffraction | 537.53 CUL Elements of X-ray diffraction | 537.53 CUL Elements of X-ray diffraction | 537.622 COL Physics of semiconductor devices | 537.622 HAM Basic semiconductor physics / |
1. Properties of X-rays. 2. Geometry of Crystals. 3. Diffraction I: Directions of Diffracted Beams. 4. Diffraction II: Intensities of Diffracted Beams. 5. Diffraction III: Non-Ideal Samples. 6. Laure Photographs. 7. Powder Photographs. 8. Diffractometer and Spectrometer. 9. Orientation and Quality of Single Crystals. 10. Structure of Polycrystalline Aggregates. 11. Determination of Crystal Structure. 12. Precise Parameter Measurements. 13. Phase-Diagram Determination. 14. Order-Disorder Transformation. 15. Chemical Analysis of X-ray Diffraction. 16. Chemical Analysis by X-ray Spectrometry. 17. Measurements of Residual Stress. 18. Polymers. 19. Small Angle Scatters. 20. Transmission Electron Microscope.
Includes bibliographical references and index.
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