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Quantitative depth profiling and diffusion in thin films / Jiangyong Wang

By: Contributor(s): Material type: TextLanguage: English Publication details: Singapore : World Scientific Publishing, 2025.Description: xi, 266 p.; hbISBN:
  • 9789819811922
Subject(s): DDC classification:
  • 660.294 WAN
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Cover image Item type Current library Home library Collection Shelving location Call number Materials specified Vol info URL Copy number Status Notes Date due Barcode Item holds Item hold queue priority Course reserves
Text Books CUTN Central Library Medicine, Technology & Management Non-fiction 660.294 WAN (Browse shelf(Opens below)) Available 56744

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