Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.

By:

Goodhew, Peter J

Contributor(s):

Material type: Text

TextLanguage: English Publication details: London ; New York : Taylor & Francis, 2001.Edition: 3rd edDescription: x, 251 p. : ill. ; 24 cmISBN:

0748409688 (pbk.)

Subject(s):

Electron microscopy

DDC classification:

502.825 21 GOO

Online resources:

Contents:

1. Microscopy with light and electrons -- 2. Electrons and their interaction with the specimen -- 3. Electron diffraction -- 4. The transmission electron microscope -- 5. The scanning electron microscope -- 6. Chemical analysis in the electron microscope -- 7. Electron microscopy and other techniques

Summary: Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context.

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
General Books	CUTN Central Library Sciences	Non-fiction	502.825 GOO (Browse shelf(Opens below))	Available		42224

1. Microscopy with light and electrons --
2. Electrons and their interaction with the specimen --
3. Electron diffraction --
4. The transmission electron microscope --
5. The scanning electron microscope --
6. Chemical analysis in the electron microscope --
7. Electron microscopy and other techniques

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context.

Includes bibliographical references (p. [236]-237) and index.

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