High-resolution electron microscopy / John C.H. Spence.
Material type:
TextSeries: Monographs on the physics and chemistry of materials ; 60Publication details: Oxford : Oxford University Press, 2003.Edition: 3rd edDescription: xvi, 401 p., [4] p. of plates : ill. (some col.) ; 24 cmISBN: - 0198509154
- 9780199552757 (pbk.)
- Materials Science
- High resolution electron microscopy
- Electron microscopy
- Transmission electron microscopes
- Materials--Microscopy
- Mineralogy, Determinative
- Optical mineralogy
- Electron microscopy--Technique
- Transmission electron microscopy
- Scientific Equipment, Experiments & Techniques
- Microscopy
- Instruments & Instrumentation Engineering
- Condensed Matter Physics (liquid State & Solid State Physics)
- 502.825 21 SPE
| Item type | Current library | Collection | Call number | Status | Date due | Barcode |
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General Books
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CUTN Central Library Sciences | Non-fiction | 502.825 SPE (Browse shelf(Opens below)) | Available | 27625 |
The discovery of the Nanotube in 1991 by electron microscopy has ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. The book covers the usefulness of seeing atoms in the semiconductor industry, in materials science (where scientists strive to make new lighter,stronger, cheaper materials), and condensed matter physics (for example in the study of the new superconductors). Biologists have recently used the atomic-resolution electron microscope to obtain three-dimensional images of the Ribosome, work which is covered in this book. The books also shows how the ability to see atomic arrangements has helped us understand the properties of matter.
1. Preliminaries ; 2. Electron Optics ; 3. Wave Optics ; 4. Coherence and Fourier Optics ; 5. High-Resolution Images of Crystals and their Defects ; 6. HREM in Biology, Organic Crystals and Radiation Damage ; 7. Image Processing and Superresolution Schemes ; 8. Stem and Z-Contrast ; 9. Electron Sources and Detectors ; 10. Measurement of Electron-optical Parameters Affecting High-Resolution Images ; 11. Instabilities and the Microscope Environment ; 12. Experimental Methods ; 13. Associated Techniques
Includes bibliographical references and index.
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