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Defects in optoelectronic materials K Wada; Stella W Pang

By: Material type: TextTextLanguage: English Series: Optoelectronic properties of semiconductors and superlattices ; v. 11.Publication details: Amsterdam : Gordon and Breach Science Pub., ©2001.Description: 412 pages : illustrations ; 23 cmISBN:
  • 9056997149
  • 9789056997144
Subject(s): DDC classification:
  • 621.381 WAD
Contents:
1. Saturation of Free Carrier Concentration in Semiconductors / W. Walukiewicz -- 2. Point of Defect Formation Near Surfaces / K. Wada -- 3. Optical Characterization of Plasma Etching Induced Damage / E.L. Hu and C.-H. Chen -- 4. Dry Etch Damage in Widegap Semiconductor Materials / S.J. Pearton and R.J. Shul -- 5. Generation, Removal, and Passivation of Plasma Process Induced Defects / S.W. Pang -- 6. Defects Induced by Metal Semiconductor Contacts Formation / T. Okumura -- 7. Electrical Characterization of Defects Introduced in Epitaxially Grown GaAs by Electron-, Proton- and He-Ion Irradiation / F.D. Auret -- 8. Instability and Defect Reaction / Y. Shinozuka -- 9. Defects and Device Degradation / K. Wada and H. Fushimi.
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Holdings
Item type Current library Collection Call number Status Date due Barcode
General Books General Books CUTN Central Library Medicine, Technology & Management Non-fiction 621.381 WAD (Browse shelf(Opens below)) Available 30274

1. Saturation of Free Carrier Concentration in Semiconductors / W. Walukiewicz --
2. Point of Defect Formation Near Surfaces / K. Wada --

3. Optical Characterization of Plasma Etching Induced Damage / E.L. Hu and C.-H. Chen --


4. Dry Etch Damage in Widegap Semiconductor Materials / S.J. Pearton and R.J. Shul --



5. Generation, Removal, and Passivation of Plasma Process Induced Defects / S.W. Pang --



6. Defects Induced by Metal Semiconductor Contacts Formation / T. Okumura --




7. Electrical Characterization of Defects Introduced in Epitaxially Grown GaAs by Electron-, Proton- and He-Ion Irradiation / F.D. Auret --

8. Instability and Defect Reaction / Y. Shinozuka --







9. Defects and Device Degradation / K. Wada and H. Fushimi.







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