Defects in optoelectronic materials K Wada; Stella W Pang
Material type: TextLanguage: English Series: Optoelectronic properties of semiconductors and superlattices ; v. 11.Publication details: Amsterdam : Gordon and Breach Science Pub., ©2001.Description: 412 pages : illustrations ; 23 cmISBN:- 9056997149
- 9789056997144
- 621.381 WAD
Item type | Current library | Collection | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
General Books | CUTN Central Library Medicine, Technology & Management | Non-fiction | 621.381 WAD (Browse shelf(Opens below)) | Available | 30274 |
1. Saturation of Free Carrier Concentration in Semiconductors / W. Walukiewicz --
2. Point of Defect Formation Near Surfaces / K. Wada --
3. Optical Characterization of Plasma Etching Induced Damage / E.L. Hu and C.-H. Chen --
4. Dry Etch Damage in Widegap Semiconductor Materials / S.J. Pearton and R.J. Shul --
5. Generation, Removal, and Passivation of Plasma Process Induced Defects / S.W. Pang --
6. Defects Induced by Metal Semiconductor Contacts Formation / T. Okumura --
7. Electrical Characterization of Defects Introduced in Epitaxially Grown GaAs by Electron-, Proton- and He-Ion Irradiation / F.D. Auret --
8. Instability and Defect Reaction / Y. Shinozuka --
9. Defects and Device Degradation / K. Wada and H. Fushimi.
There are no comments on this title.